| Nikon Accelerates Development Plans for
ArF Immersion
Belmont, Calif., February 19, 2004 -
Nikon Corporation announced today that it has accelerated its
development plans for ArF immersion and will ship a system with
a projection lens NA of greater than or equal to 1.0 in the second
half of 2005. Nikon’s previous plan was to market an immersion
system with an NA of 0.92 by mid 2005. By accelerating the development
of an immersion system with a new ultra high NA lens, Nikon will
be the first company in the world to ship a system with a projection
lens NA of 1.0 or greater. The system will be used for mass production
of 60 nm devices and advanced development of 45 nm devices.
Nikon has been a pioneer in the development of immersion lithography,
which can extend ArF exposure technology down to the 45 nm device
node. Immersion lithography provides higher resolution and better
depth of focus with minimal change to the process. Many semiconductor
manufacturers will require immersion lithography for device shrinks
below 65 nm.
Nikon started basic development for this technology early on
and feasibility studies have been performed jointly with Tokyo
Electron (TEL) since June, 2003. As a result of these activities,
no bottlenecks preventing the realization of ArF immersion exposure
were identified. It was consequently decided to move the technology
to the development stage in December of 2003. Nikon’s newly
accelerated schedule is shown below.
| Nikon’s Product Introduction
Schedule |
| 2004 |
Begin customer demonstrations and evaluations
on engineering system for ArF immersion lithography. Development
based on the currently marketed NSR-S307E, with a projection
lens NA of 0.85. |
| 2005 |
Completion of initial mass production tool. Development
based on successor of NSR-S307E, with an NA of 1.0 or greater. |
“Nikon continues to push the technology envelope” stated
Geoff Wild CEO of Nikon Precision, Inc. He continued “Our
customers need an immersion system with an NA of 1.0 or greater
and no one else has the lens technology and immersion expertise
to deliver a tool in 2005. We’ve made significant progress
with immersion development, enabling us to accelerate our schedule.”
About Immersion Lithography
Traditionally the light source wavelength and numerical aperture (NA)
have dictated the resolution of a lithography system. NA is derived from NA =
n x sin θ,
where n is the refractive index of the medium through which the exposure
light passes, and θ is the angle the exposure light forms.
Normal exposure is processed in air, and in that case n = 1. In immersion
lithography, by contrast, a liquid that has a refractive index that is greater
than 1 is introduced between the projection lens and the wafer. In terms
of the definition of the projection optics NA, the n increases in the equation
NA = n sin θ. With the same angle of incidence, the minimum resolution
can be reduced (improved). In an immersion lithography system using an ArF
laser as the light source, de-ionized water with an index of refraction of
1.44 is introduced between the projection lens and the wafer. Although this
method is used conventionally in microscopes, only in recent years has serious
research started for applications to immersion lithography exposure tools.
About Nikon
Since 1980, Nikon Corporation has been revolutionizing lithography
with innovative products and technologies. The company is a worldwide
leader in lithography equipment for the microelectronics manufacturing
industry with more than 7,200 exposure systems installed worldwide.
Nikon offers the most extensive selection of production-class
steppers and scanners in the industry. These products serve the
semiconductor, flat panel display (LCD) and thin-film magnetic
head (TFH) industries. Nikon Precision Inc. provides service,
training, applications and technical support, as well as sales
and marketing for Nikon lithography equipment in North America.
This press release contains forward-looking statements as
that term is defined in the Private Securities Reform Act of
1995, which are subject to known and unknown risks and uncertainties
that could cause actual results to differ materially from those
expressed or implied by such statements. Such statements are subject
to risks, uncertainties and changes in condition, particularly
those related to industry requirements and other risks. The Company
undertakes no obligation to update the information in this press
release.
###
Contact:
Bernie Wood
Director of Marketing
Nikon Precision Inc.
(650) 413-8533 phone
bwood@nikon.com |